Four probe high resistance tester FTZ-45

The instrument consists of a test bench, four probe heads, a computer, and software.
The four-probe resistance tester has a conventional resistance range for measuring the conductivity, resistivity, sheet resistance, film thickness and other parameters of materials such as sheets, films, blocks, rods, etc., such as conductive films on glass or ceramics (ITO) Thickness or square resistance, resistivity of silicon wafers and semiconductors, conductivity of sheet metal, conductive rubber and antistatic materials, etc. There are also resistance testers with different combinations such as high resistance range, double electric measurement method, and thickness sensor. Suitable styles can be selected according to needs. The advantage of the four-probe measurement method is that it eliminates the influence of the contact resistance between the probe and the sample.
Thickness parameters include the resistivity of known materials and the thickness of conductive film calculated by square resistance, which is suitable for testing pure materials. The thickness of the film material can also be measured directly through the thickness sensor with sub-micron accuracy while measuring the resistance, ensuring that the thickness and resistance are measured at the same position of the sample, which is especially suitable for the measurement of uneven film and sheet materials. At the same time, the semi-automatic thickness measurement and recording avoids human error, can obtain higher accuracy, and also meets the development direction of laboratory intelligence and data. This feature is the first in China.
It is a multi-purpose comprehensive measuring instrument that uses straight or square four-point probes to test resistivity/square resistance according to the improved van der Pauw measurement method, in line with GB/T 1551-2009 "silicon single crystal resistivity measurement method", and reference American ASTM standards. It can measure the resistivity, square resistance and corresponding ambient temperature of the material, as well as the contact resistance of the components.