-
Four-probe resistance tester series function configuration comparison table
|
name
|
Conventional resistance 30MΩ
|
High resistance
1200MΩ
|
Double electric test
|
Thickness measurement
|
Calculated thickness
|
Temperature measurement
|
pressure
|
Foot switch
|
|
Four probe resistance tester
|
√
|
|
|
|
√
|
√
|
|
|
|
Four probe high resistance tester
|
|
√
|
|
|
√
|
√
|
|
|
|
Four probe double electric resistance tester
|
√
|
|
√
|
|
√
|
√
|
|
√
|
|
Four-probe double electric resistance tester
|
|
√
|
√
|
|
√
|
√
|
|
√
|
|
Four probe double electric thickness resistance tester
|
√
|
|
√
|
√
|
√
|
√
|
|
√
|
|
Four probe double electric thickness high resistance tester
|
|
√
|
√
|
√
|
√
|
√
|
Optional
|
√
|
|
Four-probe square resistance tester
|
|
√
|
|
|
√
|
√
|
Optional
|
√
|
Four probe high resistance tester FTZ-45
|
Resistance measurement range
|
0.1µΩ~1200MΩ
|
|
Resistance test accuracy
|
0.02%FS
|
|
Minimum resolution of resistance
|
0.01µΩ
|
|
Probe pressure
|
20~300g
|
|
Temperature measurement range
|
-10~100℃
|
|
power
|
20W
|
|
Test platform size
|
385mm (length) *249mm (width) *102mm (height)
|
SMD components are manufactured, and the test platform is made of highly wear-resistant and highly insulating materials, which are stable and reliable, with higher precision, and a large resistance range
Optional different probes, can test a variety of materials, high wear-resistant tungsten carbide probe probes can test the resistivity/square resistance of hard materials such as silicon semiconductors, metals, conductive plastics, etc.; spherical gold-plated copper alloy probes can be Measure the resistivity/square resistance of conductive films (ITO films) or nano-coatings on flexible materials such as conductive films, metal coatings or films, ceramics or glass substrates, etc. It can also be used to measure the body resistance of resistors, low and median resistances of metal conductors, and switch-type contact resistances by changing to different test fixtures.
Four probe double electric resistance tester FTZ-42S
|
Resistance measurement range
|
0.1µΩ~30MΩ
|
|
Resistance test accuracy
|
0.05%FS
|
|
Minimum resolution of resistance
|
0.01µΩ
|
|
Probe pressure
|
20~300g
|
|
Temperature measurement range
|
0~100℃
|
|
power
|
20W
|
|
Test platform size
|
385mm (length) *249mm (width) *102mm (height)
|
Four-probe double electric resistance tester FTZ-45S
Optional different probes, can test a variety of materials, high wear-resistant tungsten carbide probe probes can test the resistivity/square resistance of hard materials such as silicon semiconductors, metals, conductive plastics, etc.; spherical gold-plated copper alloy probes can be Measure the resistivity/square resistance of conductive films (ITO films) or nano-coatings on flexible materials such as conductive films, metal coatings or films, ceramics or glass substrates, etc. It can also be used to measure the body resistance of resistors, low and median resistances of metal conductors, and switch-type contact resistances by changing to different test fixtures.
Four-probe double electric resistance tester FTZ-45S
|
Resistance measurement range
|
0.1µΩ~1200MΩ
|
|
Resistance test accuracy
|
0.02%FS
|
|
Minimum resolution of resistance
|
0.01µΩ
|
|
Probe pressure
|
20~300g
|
|
Temperature measurement range
|
-10~100℃
|
|
power
|
20W
|
|
Test platform size
|
385mm (length) *249mm (width) *102mm (height)
|
In addition to the basic features, it has a dual electrical measurement function, which eliminates the error caused by the inaccurate distance between the sample edge and the probe. The measurement range is large, and the test range is wider. It is especially suitable for use in units with large resistance ranges such as testing institutions and research institutes.
Optional different probes, can test a variety of materials, high wear-resistant tungsten carbide probe probes can test the resistivity/square resistance of hard materials such as silicon semiconductors, metals, conductive plastics, etc.; spherical gold-plated copper alloy probes can be Measure the resistivity/square resistance of conductive films (ITO films) or nano-coatings on flexible materials such as conductive films, metal coatings or films, ceramics or glass substrates, etc. It can also be used to measure the body resistance of resistors, low and median resistances of metal conductors, and switch-type contact resistances by changing to different test fixtures.
Four probe double electric thickness resistance tester FTZ-42ST
|
Resistance measurement range
|
0.1µΩ~30MΩ
|
|
Resistance test accuracy
|
0.05%FS
|
|
Minimum resolution of resistance
|
0.01µΩ
|
|
Probe pressure
|
20~300g
|
|
Temperature measurement range
|
0~100℃
|
|
power
|
20W
|
|
Thickness measurement range
|
0~10mm
|
|
Precision
|
1µm
|
|
Thickness resolution
|
0.01µm
|
|
size
|
385mm (length) *249mm (width) *102mm (height)
|
In addition to high accuracy, stability and reliability, the dual electrical measurement function eliminates the error caused by the distance between the sample and the probe. At the same time, the thickness of the sample can be measured while the resistance is measured, avoiding manual input errors, and ensuring that the thickness and resistance are taken at the same position of the sample. Value to avoid test errors caused by uneven sample thickness.
Optional different probes, can test a variety of materials, high wear-resistant tungsten carbide probe probes can test the resistivity/square resistance of hard materials such as silicon semiconductors, metals, conductive plastics, etc.; spherical gold-plated copper alloy probes can be Measure the resistivity/square resistance of conductive films (ITO films) or nano-coatings on flexible materials such as conductive films, metal coatings or films, ceramics or glass substrates, etc. It can also be used to measure the body resistance of resistors, low and median resistances of metal conductors, and switch-type contact resistances by changing to different test fixtures.
FTZ-45ST four-probe double electric thickness and high resistance tester
|
Resistance measurement range
|
0.1µΩ~1200MΩ
|
|
Resistance test accuracy
|
0.02%FS
|
|
Minimum resolution of resistance
|
0.01µΩ
|
|
Probe pressure
|
20~300g
|
|
Temperature measurement range
|
-10~100℃
|
|
power
|
20W
|
|
size
|
385mm (length) *249mm (width) *102mm (height)
|
In addition to high accuracy, stability and reliability, the dual electrical measurement function eliminates the error caused by the distance between the sample and the probe. At the same time, the thickness of the sample can be measured while the resistance is measured, avoiding manual input errors, and ensuring that the thickness and resistance are taken at the same position of the sample. Value to avoid test errors caused by uneven sample thickness.
Optional different probes, can test a variety of materials, high wear-resistant tungsten carbide probe probes can test the resistivity/square resistance of hard materials such as silicon semiconductors, metals, conductive plastics, etc.; spherical gold-plated copper alloy probes can be Measure the resistivity/square resistance of conductive films (ITO films) or nano-coatings on flexible materials such as conductive films, metal coatings or films, ceramics or glass substrates, etc. It can also be used to measure the body resistance of resistors, low and median resistances of metal conductors, and switch-type contact resistances by changing to different test fixtures.
